Tag Archive for 'device'

Mean time between failures

Mean time between failures (MTBF) is the mean (average) time between failures of a system, and is often attributed to the “useful life” of the device i.e. not including ‘infant mortality’ or ‘end of life’ if the device is not repairable. Calculations of MTBF assume that a system is “renewed”, i.e. fixed, after each failure, and then returned to service immediately after failure. The average time between failing and being returned to service is termed mean down time (MDT) or mean time to repair (MTTR).

It's just a matter of time.

It's just a matter of time.

Mathematically, the MTBF is the sum of the MTTF (mean time to failure) and MTTR (mean time to repair). The MTTF is simply the reciprocal of the failure rate, Continue reading ‘Mean time between failures’